From 7dcde20caeb50472299d82eb470e103cdb067766 Mon Sep 17 00:00:00 2001 From: github-actions Date: Thu, 15 Aug 2024 14:21:19 +0000 Subject: [PATCH] update documents --- data/ANSI_C63.14-2014.yaml | 51 ++++++++ data/ANSI_C63.14-2014_REDLINE.yaml | 34 +++++ data/ANSI_C63.15-2010.yaml | 10 ++ data/ANSI_C63.4-2014.yaml | 17 +++ data/ANSI_N42.34-2015.yaml | 34 +++++ data/ANSI_USEMCSC_C63.2-2023.yaml | 17 +++ data/EEE_1671.1-2017.yaml | 34 +++++ data/IEEE_1003.1-2017.yaml | 34 +++++ data/IEEE_1159.3-2019.yaml | 34 +++++ data/IEEE_1609.3-2020.yaml | 34 +++++ data/IEEE_1636.1-2018.yaml | 153 ++++++++++++++++++++++ data/IEEE_1717-2024.yaml | 131 ++++++++++++++++++ data/IEEE_1800-2017.yaml | 17 +++ data/IEEE_286-2024.yaml | 121 +++++++++++++++++ data/IEEE_515-2017.yaml | 68 ++++++++++ data/IEEE_830-1998.yaml | 34 +++++ data/IEEE_C37.011-2019.yaml | 17 +++ data/IEEE_C37.20.9A-2024.yaml | 51 ++++++++ data/IEEE_C37.63-2013.yaml | 17 +++ data/IEEE_C37.63-2013_REDLINE.yaml | 17 +++ data/IEEE_C57.105_COR1-2023.yaml | 34 +++++ data/IEEE_C57.12.28-2023.yaml | 17 +++ data/IEEE_C57.12.29-2023.yaml | 17 +++ data/IEEE_C57.12.40-2017.yaml | 17 +++ data/IEEE_C57.12.40-2024.yaml | 4 +- data/IEEE_P1679.1_D-2.20-2024-06.yaml | 34 +++++ data/IEEE_P1722.REV1_D-13-2015-04.yaml | 17 +++ data/IEEE_P802.15.7A_D-6-2023-09.yaml | 17 +++ data/IEEE_P802.15.7A_D-7-2024-05.yaml | 34 +++++ data/IEEE_P802.15.7A_D-8-2024-07.yaml | 34 +++++ data/IEEE_PC37.09A_D-1.2-2024-07.yaml | 34 +++++ data/IEEE_PC37.20.1_D-10-2024-06.yaml | 34 +++++ data/IEEE_PC37.20.6_D-5-2024-03.yaml | 17 +++ data/IEEE_PC37.20.6_D-6-2024-03.yaml | 34 +++++ data/IEEE_PC37.20.7_D-8-2024-03.yaml | 34 +++++ data/IEEE_PC37.20.7_D-9-2024-05.yaml | 17 +++ data/IEEE_PC37.20.9A_D-1-2024-01.yaml | 17 +++ data/IEEE_PC37.20.9A_D-2-2023-09.yaml | 17 +++ data/IEEE_PC37.20.9A_D-4-2024-04.yaml | 17 +++ data/IEEE_PC37.20.9A_D-5-2024-04.yaml | 51 ++++++++ data/IEEE_PC37.24_D-8-2024-06.yaml | 34 +++++ data/IEEE_PC37.41_D-5C-2024.yaml | 17 +++ data/IEEE_PC37.41_D-6-2024-07.yaml | 17 +++ data/IEEE_PC57.105-2019.yaml | 17 +++ data/IEEE_PC57.105_D-1_COR1-2022.yaml | 17 +++ data/IEEE_PC57.105_D-3_COR1-2023-06.yaml | 17 +++ data/IEEE_PC57.12.28_D-5-2023-02.yaml | 17 +++ data/IEEE_PC57.12.28_D-7.3-2023-09.yaml | 17 +++ data/IEEE_PC57.12.29_D-2.5-2023-02.yaml | 17 +++ data/IEEE_PC57.12.29_D-7.3-2023-09.yaml | 17 +++ data/ISO_IEC_IEEE_8802.22-2015.yaml | 20 +++ data/ISO_IEC_IEEE_DIS_P41062-2024-02.yaml | 17 +++ 52 files changed, 1644 insertions(+), 2 deletions(-) create mode 100644 data/IEEE_1717-2024.yaml create mode 100644 data/IEEE_286-2024.yaml diff --git a/data/ANSI_C63.14-2014.yaml b/data/ANSI_C63.14-2014.yaml index b90a3048bc9..7c8cad67cf8 100644 --- a/data/ANSI_C63.14-2014.yaml +++ b/data/ANSI_C63.14-2014.yaml @@ -711,6 +711,57 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: ANSIC63.14-2009 + docid: + - id: ANSI C63.14-2009 + type: IEEE + primary: true + formattedref: + content: ANSI C63.14-2009 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: ANSIC63.14-2009 + docid: + - id: ANSI C63.14-2009 + type: IEEE + primary: true + formattedref: + content: ANSI C63.14-2009 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: ANSIC63.14-2009 + docid: + - id: ANSI C63.14-2009 + type: IEEE + primary: true + formattedref: + content: ANSI C63.14-2009 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: ANSI standards - content: Dictionaries diff --git a/data/ANSI_C63.14-2014_REDLINE.yaml b/data/ANSI_C63.14-2014_REDLINE.yaml index 2f22dcd8d9e..03e76c2c6f7 100644 --- a/data/ANSI_C63.14-2014_REDLINE.yaml +++ b/data/ANSI_C63.14-2014_REDLINE.yaml @@ -424,6 +424,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: ANSIC63.14-2009 + docid: + - id: ANSI C63.14-2009 + type: IEEE + primary: true + formattedref: + content: ANSI C63.14-2009 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: ANSIC63.14-2009 + docid: + - id: ANSI C63.14-2009 + type: IEEE + primary: true + formattedref: + content: ANSI C63.14-2009 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Electromagnetic compatibility diff --git a/data/ANSI_C63.15-2010.yaml b/data/ANSI_C63.15-2010.yaml index 016fc64060e..aab7c8f40af 100644 --- a/data/ANSI_C63.15-2010.yaml +++ b/data/ANSI_C63.15-2010.yaml @@ -161,6 +161,16 @@ relation: formattedref: content: ANSI C63.15-2017 format: text/plain +- type: obsoletedBy + bibitem: + id: ANSIC63.15-2017 + docid: + - id: ANSI C63.15-2017 + type: IEEE + primary: true + formattedref: + content: ANSI C63.15-2017 + format: text/plain keyword: - content: IEEE standards - content: electromagnetic compatibility diff --git a/data/ANSI_C63.4-2014.yaml b/data/ANSI_C63.4-2014.yaml index fe072220429..70e7320bdd9 100644 --- a/data/ANSI_C63.4-2014.yaml +++ b/data/ANSI_C63.4-2014.yaml @@ -1693,6 +1693,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: ANSIC63.4-2009 + docid: + - id: ANSI C63.4-2009 + type: IEEE + primary: true + formattedref: + content: ANSI C63.4-2009 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: ANSI standards - content: Noise measurement diff --git a/data/ANSI_N42.34-2015.yaml b/data/ANSI_N42.34-2015.yaml index 6674744a2b7..04d23f701a5 100644 --- a/data/ANSI_N42.34-2015.yaml +++ b/data/ANSI_N42.34-2015.yaml @@ -853,6 +853,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: ANSIN42.34-2006 + docid: + - id: ANSI N42.34-2006 + type: IEEE + primary: true + formattedref: + content: ANSI N42.34-2006 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: ANSIN42.34-2006 + docid: + - id: ANSI N42.34-2006 + type: IEEE + primary: true + formattedref: + content: ANSI N42.34-2006 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: ANSI Standards - content: Gamma rays diff --git a/data/ANSI_USEMCSC_C63.2-2023.yaml b/data/ANSI_USEMCSC_C63.2-2023.yaml index cbcff008a32..98699026474 100644 --- a/data/ANSI_USEMCSC_C63.2-2023.yaml +++ b/data/ANSI_USEMCSC_C63.2-2023.yaml @@ -1641,6 +1641,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: ANSIC63.2-2016 + docid: + - id: ANSI C63.2-2016 + type: IEEE + primary: true + formattedref: + content: ANSI C63.2-2016 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Electromagnetic interference diff --git a/data/EEE_1671.1-2017.yaml b/data/EEE_1671.1-2017.yaml index d0e171caf0d..92563dd253c 100644 --- a/data/EEE_1671.1-2017.yaml +++ b/data/EEE_1671.1-2017.yaml @@ -1207,6 +1207,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE1671.1-2009 + docid: + - id: IEEE 1671.1-2009 + type: IEEE + primary: true + formattedref: + content: IEEE 1671.1-2009 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1671.1-2009 + docid: + - id: IEEE 1671.1-2009 + type: IEEE + primary: true + formattedref: + content: IEEE 1671.1-2009 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: XML diff --git a/data/IEEE_1003.1-2017.yaml b/data/IEEE_1003.1-2017.yaml index 9de5e6d51a2..a7e38ffbf4b 100644 --- a/data/IEEE_1003.1-2017.yaml +++ b/data/IEEE_1003.1-2017.yaml @@ -528,6 +528,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE1003.1-2008 + docid: + - id: IEEE 1003.1-2008 + type: IEEE + primary: true + formattedref: + content: IEEE 1003.1-2008 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1003.1-2008 + docid: + - id: IEEE 1003.1-2008 + type: IEEE + primary: true + formattedref: + content: IEEE 1003.1-2008 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Operating systems diff --git a/data/IEEE_1159.3-2019.yaml b/data/IEEE_1159.3-2019.yaml index 5c2bc7261ad..14872408012 100644 --- a/data/IEEE_1159.3-2019.yaml +++ b/data/IEEE_1159.3-2019.yaml @@ -652,6 +652,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE1159.3-2003 + docid: + - id: IEEE 1159.3-2003 + type: IEEE + primary: true + formattedref: + content: IEEE 1159.3-2003 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1159.3-2003 + docid: + - id: IEEE 1159.3-2003 + type: IEEE + primary: true + formattedref: + content: IEEE 1159.3-2003 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Power distribution diff --git a/data/IEEE_1609.3-2020.yaml b/data/IEEE_1609.3-2020.yaml index 88f8e0db8f7..631fdb60cd6 100644 --- a/data/IEEE_1609.3-2020.yaml +++ b/data/IEEE_1609.3-2020.yaml @@ -2332,6 +2332,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE1609.3-2016 + docid: + - id: IEEE 1609.3-2016 + type: IEEE + primary: true + formattedref: + content: IEEE 1609.3-2016 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1609.3-2016 + docid: + - id: IEEE 1609.3-2016 + type: IEEE + primary: true + formattedref: + content: IEEE 1609.3-2016 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Open systems diff --git a/data/IEEE_1636.1-2018.yaml b/data/IEEE_1636.1-2018.yaml index 3b2ac09d313..b1acf941b91 100644 --- a/data/IEEE_1636.1-2018.yaml +++ b/data/IEEE_1636.1-2018.yaml @@ -2164,6 +2164,159 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE1636.1-2013Redline + docid: + - id: IEEE 1636.1-2013 Redline + type: IEEE + primary: true + formattedref: + content: IEEE 1636.1-2013 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1636.1-2013Redline + docid: + - id: IEEE 1636.1-2013 Redline + type: IEEE + primary: true + formattedref: + content: IEEE 1636.1-2013 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1636.1-2013Redline + docid: + - id: IEEE 1636.1-2013 Redline + type: IEEE + primary: true + formattedref: + content: IEEE 1636.1-2013 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1636.1-2013Redline + docid: + - id: IEEE 1636.1-2013 Redline + type: IEEE + primary: true + formattedref: + content: IEEE 1636.1-2013 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1636.1-2013Redline + docid: + - id: IEEE 1636.1-2013 Redline + type: IEEE + primary: true + formattedref: + content: IEEE 1636.1-2013 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1636.1-2013Redline + docid: + - id: IEEE 1636.1-2013 Redline + type: IEEE + primary: true + formattedref: + content: IEEE 1636.1-2013 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1636.1-2013Redline + docid: + - id: IEEE 1636.1-2013 Redline + type: IEEE + primary: true + formattedref: + content: IEEE 1636.1-2013 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1636.1-2013Redline + docid: + - id: IEEE 1636.1-2013 Redline + type: IEEE + primary: true + formattedref: + content: IEEE 1636.1-2013 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1636.1-2013Redline + docid: + - id: IEEE 1636.1-2013 Redline + type: IEEE + primary: true + formattedref: + content: IEEE 1636.1-2013 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Software maintenance diff --git a/data/IEEE_1717-2024.yaml b/data/IEEE_1717-2024.yaml new file mode 100644 index 00000000000..eeb208a66b9 --- /dev/null +++ b/data/IEEE_1717-2024.yaml @@ -0,0 +1,131 @@ +--- +schema-version: v1.2.3 +id: IEEE1717-2024 +title: +- content: IEEE Standard for Testing Fire-Resistive, Circuit Integrity Cables and + Cable Systems Using a Hydrocarbon Pool Fire Test Protocol + format: text/plain + type: main +link: +- content: https://ieeexplore.ieee.org/document/10636027 + type: src +type: standard +docid: +- id: IEEE 1717-2024 + type: IEEE + primary: true +- id: IEEE 1717™-2024 + type: IEEE + scope: trademark + primary: true +- id: 979-8-8557-0862-2 + type: ISBN +- id: 10.1109/IEEESTD.2024.10636027 + type: DOI +docnumber: IEEE 1717-2024 +date: +- type: created + value: '2024-08-15' +- type: published + value: '2024-08-14' +- type: issued + value: '2024-05-20' +contributor: +- organization: + name: + - content: Institute of Electrical and Electronics Engineers + abbreviation: + content: IEEE + url: http://www.ieee.org + contact: + - address: + city: New York + country: USA + role: + - type: publisher +revdate: '2024-08-14' +language: +- en +script: +- Latn +abstract: +- content: Standardization of circuit integrity cable testing is beneficial to cable + manufacturers, distributors, and users. Uniform procedures, consistent, repeatable + results, and measurable test acceptance criteria are required to allow comparisons + among competing products and to allow selection of the correct product for the + application. + language: + - en + script: + - Latn + format: text/plain +docstatus: + stage: + value: approved +copyright: +- owner: + - name: + - content: Institute of Electrical and Electronics Engineers + abbreviation: + content: IEEE + url: http://www.ieee.org + from: '2024' +relation: +- type: updates + bibitem: + id: IEEE1717-2012 + docid: + - id: IEEE 1717-2012 + type: IEEE + primary: true + formattedref: + content: IEEE 1717-2012 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +keyword: +- content: IEEE Standards +- content: Circuit analysis +- content: Emergency services +- content: Fire safety +- content: Hydrocarbons +- content: Motors +- content: Remote control +- content: cable +- content: circuit integrity +- content: EIV +- content: emergency isolation valves +- content: emergency shutdown +- content: fire-safe +- content: horizontal furnace +- content: hydrocarbon pool fire +- content: hydrocarbons +- content: IEEE 1717™ +- content: motor operated valves +- content: MOV +- content: rapid rise +- content: remote operated shut off valves +- content: ROSOV +- content: safety systems +- content: test protocol +- content: wire +doctype: standard +editorialgroup: + committee: + - Insulated Conductors of the IEEE Power and Energy Society +ics: +- code: 13.220.40 + text: Ignitability and burning behaviour of materials and products +- code: 29.060.20 + text: Cables +ext: + schema-version: v1.0.0 + standard_status: Active + standard_modified: Approved + pubstatus: Active + holdstatus: Publish diff --git a/data/IEEE_1800-2017.yaml b/data/IEEE_1800-2017.yaml index 70610afd906..0fc9e6d67c1 100644 --- a/data/IEEE_1800-2017.yaml +++ b/data/IEEE_1800-2017.yaml @@ -1906,6 +1906,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE1800-2012 + docid: + - id: IEEE 1800-2012 + type: IEEE + primary: true + formattedref: + content: IEEE 1800-2012 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Programming languages diff --git a/data/IEEE_286-2024.yaml b/data/IEEE_286-2024.yaml new file mode 100644 index 00000000000..7549b56fe64 --- /dev/null +++ b/data/IEEE_286-2024.yaml @@ -0,0 +1,121 @@ +--- +schema-version: v1.2.3 +id: IEEE286-2024 +title: +- content: IEEE Recommended Practice for Measurement of Power Factor Tip-Up of Electric + Machinery Stator Coil Insulation + format: text/plain + type: main +link: +- content: https://ieeexplore.ieee.org/document/10636032 + type: src +type: standard +docid: +- id: IEEE 286-2024 + type: IEEE + primary: true +- id: IEEE 286™-2024 + type: IEEE + scope: trademark + primary: true +- id: 979-8-8557-0971-1 + type: ISBN +- id: 10.1109/IEEESTD.2024.10636032 + type: DOI +docnumber: IEEE 286-2024 +date: +- type: created + value: '2024-08-15' +- type: published + value: '2024-08-14' +- type: issued + value: '2024-03-21' +contributor: +- organization: + name: + - content: Institute of Electrical and Electronics Engineers + abbreviation: + content: IEEE + url: http://www.ieee.org + contact: + - address: + city: New York + country: USA + role: + - type: publisher +revdate: '2024-08-14' +language: +- en +script: +- Latn +abstract: +- content: Covered in this recommended practice are power factor and power factor + tip-up testing of stator coils and bars for use in large electric machinery. This + document also defines power factor, tangent delta, dissipation factor, and conversions + between these values. + language: + - en + script: + - Latn + format: text/plain +docstatus: + stage: + value: approved +copyright: +- owner: + - name: + - content: Institute of Electrical and Electronics Engineers + abbreviation: + content: IEEE + url: http://www.ieee.org + from: '2024' +relation: +- type: updates + bibitem: + id: IEEE286-2000 + docid: + - id: IEEE 286-2000 + type: IEEE + primary: true + formattedref: + content: IEEE 286-2000 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +keyword: +- content: IEEE Standards +- content: Capacitance measurement +- content: Generators +- content: Reactive power +- content: Stator windings +- content: Coils +- content: Insulation testing +- content: Electric machines +- content: cell capacitance +- content: coil +- content: dissipation +- content: electric generators +- content: IEEE 286 +- content: power factor +- content: stator bar +- content: stator winding +- content: tan delta +- content: tangent delta +doctype: standard +editorialgroup: + committee: + - Electric Machinery of the IEEE Power and Energy Society +ics: +- code: 29.080.30 + text: Insulation systems +ext: + schema-version: v1.0.0 + standard_status: Active + standard_modified: Approved + pubstatus: Active + holdstatus: Publish diff --git a/data/IEEE_515-2017.yaml b/data/IEEE_515-2017.yaml index f844ea78ba4..794d694d70c 100644 --- a/data/IEEE_515-2017.yaml +++ b/data/IEEE_515-2017.yaml @@ -749,6 +749,74 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE515-2011 + docid: + - id: IEEE 515-2011 + type: IEEE + primary: true + formattedref: + content: IEEE 515-2011 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE515-2011 + docid: + - id: IEEE 515-2011 + type: IEEE + primary: true + formattedref: + content: IEEE 515-2011 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE515-2011 + docid: + - id: IEEE 515-2011 + type: IEEE + primary: true + formattedref: + content: IEEE 515-2011 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE515-2011 + docid: + - id: IEEE 515-2011 + type: IEEE + primary: true + formattedref: + content: IEEE 515-2011 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Trace heating diff --git a/data/IEEE_830-1998.yaml b/data/IEEE_830-1998.yaml index 9d710d3a662..25b7dfe72da 100644 --- a/data/IEEE_830-1998.yaml +++ b/data/IEEE_830-1998.yaml @@ -544,6 +544,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE830-1993 + docid: + - id: IEEE 830-1993 + type: IEEE + primary: true + formattedref: + content: IEEE 830-1993 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE830-1993 + docid: + - id: IEEE 830-1993 + type: IEEE + primary: true + formattedref: + content: IEEE 830-1993 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: Software requirements and specifications - content: contract diff --git a/data/IEEE_C37.011-2019.yaml b/data/IEEE_C37.011-2019.yaml index 92c42cd9555..2099666c891 100644 --- a/data/IEEE_C37.011-2019.yaml +++ b/data/IEEE_C37.011-2019.yaml @@ -174,6 +174,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.011-2011 + docid: + - id: IEEE C37.011-2011 + type: IEEE + primary: true + formattedref: + content: IEEE C37.011-2011 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Transient analysis diff --git a/data/IEEE_C37.20.9A-2024.yaml b/data/IEEE_C37.20.9A-2024.yaml index 83ca14c56ad..c9fdb0139f0 100644 --- a/data/IEEE_C37.20.9A-2024.yaml +++ b/data/IEEE_C37.20.9A-2024.yaml @@ -482,6 +482,57 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.9-2019 + docid: + - id: IEEE C37.20.9-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.9-2019 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.9-2019 + docid: + - id: IEEE C37.20.9-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.9-2019 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.9-2019 + docid: + - id: IEEE C37.20.9-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.9-2019 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Switchgear diff --git a/data/IEEE_C37.63-2013.yaml b/data/IEEE_C37.63-2013.yaml index fefe2b33522..46c5272d851 100644 --- a/data/IEEE_C37.63-2013.yaml +++ b/data/IEEE_C37.63-2013.yaml @@ -102,6 +102,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.63-2005 + docid: + - id: IEEE C37.63-2005 + type: IEEE + primary: true + formattedref: + content: IEEE C37.63-2005 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE standards - content: Underwater power cables diff --git a/data/IEEE_C37.63-2013_REDLINE.yaml b/data/IEEE_C37.63-2013_REDLINE.yaml index 463e5944525..fba87a078c2 100644 --- a/data/IEEE_C37.63-2013_REDLINE.yaml +++ b/data/IEEE_C37.63-2013_REDLINE.yaml @@ -103,6 +103,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.63-2005 + docid: + - id: IEEE C37.63-2005 + type: IEEE + primary: true + formattedref: + content: IEEE C37.63-2005 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE standards - content: Power cables diff --git a/data/IEEE_C57.105_COR1-2023.yaml b/data/IEEE_C57.105_COR1-2023.yaml index 314824bbae3..8c514b1195f 100644 --- a/data/IEEE_C57.105_COR1-2023.yaml +++ b/data/IEEE_C57.105_COR1-2023.yaml @@ -871,6 +871,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC57.105-2019 + docid: + - id: IEEE C57.105-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C57.105-2019 + format: text/plain + description: + content: corrects + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC57.105-2019 + docid: + - id: IEEE C57.105-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C57.105-2019 + format: text/plain + description: + content: corrects + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Transformers diff --git a/data/IEEE_C57.12.28-2023.yaml b/data/IEEE_C57.12.28-2023.yaml index 9857f81bd56..ecd11c5f054 100644 --- a/data/IEEE_C57.12.28-2023.yaml +++ b/data/IEEE_C57.12.28-2023.yaml @@ -887,6 +887,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC57.12.28-2014 + docid: + - id: IEEE C57.12.28-2014 + type: IEEE + primary: true + formattedref: + content: IEEE C57.12.28-2014 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Coatings diff --git a/data/IEEE_C57.12.29-2023.yaml b/data/IEEE_C57.12.29-2023.yaml index 6f6f50c95fe..a2ef097e521 100644 --- a/data/IEEE_C57.12.29-2023.yaml +++ b/data/IEEE_C57.12.29-2023.yaml @@ -888,6 +888,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC57.12.29-2014 + docid: + - id: IEEE C57.12.29-2014 + type: IEEE + primary: true + formattedref: + content: IEEE C57.12.29-2014 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Voltage control diff --git a/data/IEEE_C57.12.40-2017.yaml b/data/IEEE_C57.12.40-2017.yaml index 6a75f7e5115..7927d0b72c8 100644 --- a/data/IEEE_C57.12.40-2017.yaml +++ b/data/IEEE_C57.12.40-2017.yaml @@ -393,6 +393,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC57.12.40-2011Redline + docid: + - id: IEEE C57.12.40-2011 Redline + type: IEEE + primary: true + formattedref: + content: IEEE C57.12.40-2011 Redline + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Power transformers diff --git a/data/IEEE_C57.12.40-2024.yaml b/data/IEEE_C57.12.40-2024.yaml index b43d587e495..93534250a47 100644 --- a/data/IEEE_C57.12.40-2024.yaml +++ b/data/IEEE_C57.12.40-2024.yaml @@ -28,7 +28,7 @@ date: - type: created value: '2024-08-09' - type: published - value: '2024-08-09' + value: '2024-08-08' - type: issued value: '2024-05-20' contributor: @@ -44,7 +44,7 @@ contributor: country: USA role: - type: publisher -revdate: '2024-08-09' +revdate: '2024-08-08' language: - en script: diff --git a/data/IEEE_P1679.1_D-2.20-2024-06.yaml b/data/IEEE_P1679.1_D-2.20-2024-06.yaml index 089bb6801f5..a843cdcba05 100644 --- a/data/IEEE_P1679.1_D-2.20-2024-06.yaml +++ b/data/IEEE_P1679.1_D-2.20-2024-06.yaml @@ -419,6 +419,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE1679.1-2017 + docid: + - id: IEEE 1679.1-2017 + type: IEEE + primary: true + formattedref: + content: IEEE 1679.1-2017 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE1679.1-2017 + docid: + - id: IEEE 1679.1-2017 + type: IEEE + primary: true + formattedref: + content: IEEE 1679.1-2017 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: battery - content: energy storage diff --git a/data/IEEE_P1722.REV1_D-13-2015-04.yaml b/data/IEEE_P1722.REV1_D-13-2015-04.yaml index e1f4a68f2be..c4904b5fc6a 100644 --- a/data/IEEE_P1722.REV1_D-13-2015-04.yaml +++ b/data/IEEE_P1722.REV1_D-13-2015-04.yaml @@ -510,6 +510,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE1722-2011 + docid: + - id: IEEE 1722-2011 + type: IEEE + primary: true + formattedref: + content: IEEE 1722-2011 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Media streaming diff --git a/data/IEEE_P802.15.7A_D-6-2023-09.yaml b/data/IEEE_P802.15.7A_D-6-2023-09.yaml index aaab66e64ed..94b599ef197 100644 --- a/data/IEEE_P802.15.7A_D-6-2023-09.yaml +++ b/data/IEEE_P802.15.7A_D-6-2023-09.yaml @@ -680,6 +680,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE802.15.7-2018 + docid: + - id: IEEE 802.15.7-2018 + type: IEEE + primary: true + formattedref: + content: IEEE 802.15.7-2018 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Local area networks diff --git a/data/IEEE_P802.15.7A_D-7-2024-05.yaml b/data/IEEE_P802.15.7A_D-7-2024-05.yaml index ad889d5e453..3cce1c48a8f 100644 --- a/data/IEEE_P802.15.7A_D-7-2024-05.yaml +++ b/data/IEEE_P802.15.7A_D-7-2024-05.yaml @@ -442,6 +442,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE802.15.7-2018 + docid: + - id: IEEE 802.15.7-2018 + type: IEEE + primary: true + formattedref: + content: IEEE 802.15.7-2018 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE802.15.7-2018 + docid: + - id: IEEE 802.15.7-2018 + type: IEEE + primary: true + formattedref: + content: IEEE 802.15.7-2018 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Optical communication equipment diff --git a/data/IEEE_P802.15.7A_D-8-2024-07.yaml b/data/IEEE_P802.15.7A_D-8-2024-07.yaml index 39f5b63d03c..ab69e280272 100644 --- a/data/IEEE_P802.15.7A_D-8-2024-07.yaml +++ b/data/IEEE_P802.15.7A_D-8-2024-07.yaml @@ -238,6 +238,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE802.15.7-2018 + docid: + - id: IEEE 802.15.7-2018 + type: IEEE + primary: true + formattedref: + content: IEEE 802.15.7-2018 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEE802.15.7-2018 + docid: + - id: IEEE 802.15.7-2018 + type: IEEE + primary: true + formattedref: + content: IEEE 802.15.7-2018 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain keyword: - content: amendment - content: IEEE 802.15.7 diff --git a/data/IEEE_PC37.09A_D-1.2-2024-07.yaml b/data/IEEE_PC37.09A_D-1.2-2024-07.yaml index 68e60d90c76..e58c342da22 100644 --- a/data/IEEE_PC37.09A_D-1.2-2024-07.yaml +++ b/data/IEEE_PC37.09A_D-1.2-2024-07.yaml @@ -118,6 +118,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.09-2018 + docid: + - id: IEEE C37.09-2018 + type: IEEE + primary: true + formattedref: + content: IEEE C37.09-2018 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC37.09-2018 + docid: + - id: IEEE C37.09-2018 + type: IEEE + primary: true + formattedref: + content: IEEE C37.09-2018 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain keyword: - content: Low and high temperature test - content: service capability diff --git a/data/IEEE_PC37.20.1_D-10-2024-06.yaml b/data/IEEE_PC37.20.1_D-10-2024-06.yaml index bf67196a7de..cea51bbad14 100644 --- a/data/IEEE_PC37.20.1_D-10-2024-06.yaml +++ b/data/IEEE_PC37.20.1_D-10-2024-06.yaml @@ -418,6 +418,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.1-2015 + docid: + - id: IEEE C37.20.1-2015 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.1-2015 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.1-2015 + docid: + - id: IEEE C37.20.1-2015 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.1-2015 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: circuit breaker - content: control diff --git a/data/IEEE_PC37.20.6_D-5-2024-03.yaml b/data/IEEE_PC37.20.6_D-5-2024-03.yaml index 4dc018c1c08..9895836aa49 100644 --- a/data/IEEE_PC37.20.6_D-5-2024-03.yaml +++ b/data/IEEE_PC37.20.6_D-5-2024-03.yaml @@ -884,6 +884,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.6-2015 + docid: + - id: IEEE C37.20.6-2015 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.6-2015 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: Standards - content: IEEE Standards diff --git a/data/IEEE_PC37.20.6_D-6-2024-03.yaml b/data/IEEE_PC37.20.6_D-6-2024-03.yaml index 1bb290e10c1..0f19acb34b0 100644 --- a/data/IEEE_PC37.20.6_D-6-2024-03.yaml +++ b/data/IEEE_PC37.20.6_D-6-2024-03.yaml @@ -527,6 +527,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.6-2015 + docid: + - id: IEEE C37.20.6-2015 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.6-2015 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.6-2015 + docid: + - id: IEEE C37.20.6-2015 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.6-2015 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: electrical operation - content: ground and test (G&T) devices diff --git a/data/IEEE_PC37.20.7_D-8-2024-03.yaml b/data/IEEE_PC37.20.7_D-8-2024-03.yaml index 1d608852ded..68da7c98595 100644 --- a/data/IEEE_PC37.20.7_D-8-2024-03.yaml +++ b/data/IEEE_PC37.20.7_D-8-2024-03.yaml @@ -634,6 +634,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.7-2017 + docid: + - id: IEEE C37.20.7-2017 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.7-2017 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.7-2017 + docid: + - id: IEEE C37.20.7-2017 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.7-2017 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Arc discharges diff --git a/data/IEEE_PC37.20.7_D-9-2024-05.yaml b/data/IEEE_PC37.20.7_D-9-2024-05.yaml index 3dc9a4bed99..198b8dff0e2 100644 --- a/data/IEEE_PC37.20.7_D-9-2024-05.yaml +++ b/data/IEEE_PC37.20.7_D-9-2024-05.yaml @@ -192,6 +192,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.7-2017 + docid: + - id: IEEE C37.20.7-2017 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.7-2017 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Arc discharges diff --git a/data/IEEE_PC37.20.9A_D-1-2024-01.yaml b/data/IEEE_PC37.20.9A_D-1-2024-01.yaml index cb94fe96a9b..49a9442c9af 100644 --- a/data/IEEE_PC37.20.9A_D-1-2024-01.yaml +++ b/data/IEEE_PC37.20.9A_D-1-2024-01.yaml @@ -752,6 +752,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.9-2019 + docid: + - id: IEEE C37.20.9-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.9-2019 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Switchgear diff --git a/data/IEEE_PC37.20.9A_D-2-2023-09.yaml b/data/IEEE_PC37.20.9A_D-2-2023-09.yaml index e015cdbda8e..450f436e49a 100644 --- a/data/IEEE_PC37.20.9A_D-2-2023-09.yaml +++ b/data/IEEE_PC37.20.9A_D-2-2023-09.yaml @@ -990,6 +990,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.9-2019 + docid: + - id: IEEE C37.20.9-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.9-2019 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Standards diff --git a/data/IEEE_PC37.20.9A_D-4-2024-04.yaml b/data/IEEE_PC37.20.9A_D-4-2024-04.yaml index ddf9d1de085..586695efc3d 100644 --- a/data/IEEE_PC37.20.9A_D-4-2024-04.yaml +++ b/data/IEEE_PC37.20.9A_D-4-2024-04.yaml @@ -718,6 +718,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.9-2019 + docid: + - id: IEEE C37.20.9-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.9-2019 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Standards diff --git a/data/IEEE_PC37.20.9A_D-5-2024-04.yaml b/data/IEEE_PC37.20.9A_D-5-2024-04.yaml index 168b31134aa..48d8fb56daa 100644 --- a/data/IEEE_PC37.20.9A_D-5-2024-04.yaml +++ b/data/IEEE_PC37.20.9A_D-5-2024-04.yaml @@ -854,6 +854,57 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.9-2019 + docid: + - id: IEEE C37.20.9-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.9-2019 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.9-2019 + docid: + - id: IEEE C37.20.9-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.9-2019 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC37.20.9-2019 + docid: + - id: IEEE C37.20.9-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C37.20.9-2019 + format: text/plain + description: + content: amends + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Metal enclosures diff --git a/data/IEEE_PC37.24_D-8-2024-06.yaml b/data/IEEE_PC37.24_D-8-2024-06.yaml index 5c1f8c2f8d8..32da8fb36c0 100644 --- a/data/IEEE_PC37.24_D-8-2024-06.yaml +++ b/data/IEEE_PC37.24_D-8-2024-06.yaml @@ -548,6 +548,40 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.24-2017 + docid: + - id: IEEE C37.24-2017 + type: IEEE + primary: true + formattedref: + content: IEEE C37.24-2017 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain +- type: updates + bibitem: + id: IEEEC37.24-2017 + docid: + - id: IEEE C37.24-2017 + type: IEEE + primary: true + formattedref: + content: IEEE C37.24-2017 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: absorption coefficient - content: finish diff --git a/data/IEEE_PC37.41_D-5C-2024.yaml b/data/IEEE_PC37.41_D-5C-2024.yaml index 6a87c55004d..a200fadad30 100644 --- a/data/IEEE_PC37.41_D-5C-2024.yaml +++ b/data/IEEE_PC37.41_D-5C-2024.yaml @@ -428,6 +428,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.41-2016 + docid: + - id: IEEE C37.41-2016 + type: IEEE + primary: true + formattedref: + content: IEEE C37.41-2016 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Fuses diff --git a/data/IEEE_PC37.41_D-6-2024-07.yaml b/data/IEEE_PC37.41_D-6-2024-07.yaml index 6b119d8fa9b..f31f7641ae1 100644 --- a/data/IEEE_PC37.41_D-6-2024-07.yaml +++ b/data/IEEE_PC37.41_D-6-2024-07.yaml @@ -139,6 +139,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC37.41-2016 + docid: + - id: IEEE C37.41-2016 + type: IEEE + primary: true + formattedref: + content: IEEE C37.41-2016 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Fuses diff --git a/data/IEEE_PC57.105-2019.yaml b/data/IEEE_PC57.105-2019.yaml index 2e0b8cb20f0..dc04aa02855 100644 --- a/data/IEEE_PC57.105-2019.yaml +++ b/data/IEEE_PC57.105-2019.yaml @@ -1227,6 +1227,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC57.105-2019 + docid: + - id: IEEE C57.105-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C57.105-2019 + format: text/plain + description: + content: corrects + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Ferroresonance diff --git a/data/IEEE_PC57.105_D-1_COR1-2022.yaml b/data/IEEE_PC57.105_D-1_COR1-2022.yaml index f7d1b7f426a..c0b81359029 100644 --- a/data/IEEE_PC57.105_D-1_COR1-2022.yaml +++ b/data/IEEE_PC57.105_D-1_COR1-2022.yaml @@ -1232,6 +1232,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC57.105-2019 + docid: + - id: IEEE C57.105-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C57.105-2019 + format: text/plain + description: + content: corrects + language: + - en + script: + - Latn + format: text/plain doctype: standard editorialgroup: committee: diff --git a/data/IEEE_PC57.105_D-3_COR1-2023-06.yaml b/data/IEEE_PC57.105_D-3_COR1-2023-06.yaml index d9f4e1fa239..4ff7126deb2 100644 --- a/data/IEEE_PC57.105_D-3_COR1-2023-06.yaml +++ b/data/IEEE_PC57.105_D-3_COR1-2023-06.yaml @@ -955,6 +955,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC57.105-2019 + docid: + - id: IEEE C57.105-2019 + type: IEEE + primary: true + formattedref: + content: IEEE C57.105-2019 + format: text/plain + description: + content: corrects + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Power transformers diff --git a/data/IEEE_PC57.12.28_D-5-2023-02.yaml b/data/IEEE_PC57.12.28_D-5-2023-02.yaml index 6f1bcfd8381..f85fc941891 100644 --- a/data/IEEE_PC57.12.28_D-5-2023-02.yaml +++ b/data/IEEE_PC57.12.28_D-5-2023-02.yaml @@ -851,6 +851,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEEC57.12.28-2014 + docid: + - id: IEEE C57.12.28-2014 + type: IEEE + primary: true + formattedref: + content: IEEE C57.12.28-2014 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Metal enclosures diff --git a/data/IEEE_PC57.12.28_D-7.3-2023-09.yaml b/data/IEEE_PC57.12.28_D-7.3-2023-09.yaml index 99737beac55..7eb1223d48b 100644 --- a/data/IEEE_PC57.12.28_D-7.3-2023-09.yaml +++ b/data/IEEE_PC57.12.28_D-7.3-2023-09.yaml @@ -1140,6 +1140,23 @@ relation: script: - 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Latn format: text/plain +- type: updates + bibitem: + id: IEEEC57.12.29-2014 + docid: + - id: IEEE C57.12.29-2014 + type: IEEE + primary: true + formattedref: + content: IEEE C57.12.29-2014 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: Coatings diff --git a/data/ISO_IEC_IEEE_8802.22-2015.yaml b/data/ISO_IEC_IEEE_8802.22-2015.yaml index 1f019194a8d..eedfa4cb4ed 100644 --- a/data/ISO_IEC_IEEE_8802.22-2015.yaml +++ b/data/ISO_IEC_IEEE_8802.22-2015.yaml @@ -448,6 +448,26 @@ relation: formattedref: content: IEEE 802.22-2011 format: text/plain +- type: adoptedFrom + bibitem: + id: IEEE802.22-2011 + docid: + - id: IEEE 802.22-2011 + type: IEEE + primary: true + formattedref: + content: IEEE 802.22-2011 + format: text/plain +- type: adoptedFrom + bibitem: + id: IEEE802.22-2011 + docid: + - id: IEEE 802.22-2011 + type: IEEE + primary: true + formattedref: + content: IEEE 802.22-2011 + format: text/plain keyword: - content: IEEE Standards - content: IEC Standards diff --git a/data/ISO_IEC_IEEE_DIS_P41062-2024-02.yaml b/data/ISO_IEC_IEEE_DIS_P41062-2024-02.yaml index b078a623502..0b22b74f019 100644 --- a/data/ISO_IEC_IEEE_DIS_P41062-2024-02.yaml +++ b/data/ISO_IEC_IEEE_DIS_P41062-2024-02.yaml @@ -1490,6 +1490,23 @@ relation: script: - Latn format: text/plain +- type: updates + bibitem: + id: IEEE1062-2015 + docid: + - id: IEEE 1062-2015 + type: IEEE + primary: true + formattedref: + content: IEEE 1062-2015 + format: text/plain + description: + content: revises + language: + - en + script: + - Latn + format: text/plain keyword: - content: IEEE Standards - content: ISO Standards